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- Scanning electron microscope / SEM
Scanning electron microscope / SEM / List of 3 manufacturers
What is a Scanning electron microscope / SEM?
The Scanning Electron Microscope (SEM) is an electron microscope used to examine the surface of a sample at high resolution. It works by scanning the surface of the sample with an electron beam, detecting secondary electrons and reflected electrons, and using this data to create detailed images. SEM provides much higher resolution than optical microscopes, allowing observation of structures as small as several nanometers.
The working principle of SEM involves directing an electron beam onto the surface of the sample, which generates secondary electrons, backscattered electrons, or characteristic X-rays. These signals are analyzed to create detailed images of the sample's surface and structural features. SEM is ideal for studying the fine surface structures, morphology, and chemical composition of materials.
SEM is widely used in fields such as materials science, biology, and semiconductor industries. It is especially useful for detecting surface defects and analyzing microstructures. The technology can be applied to a wide variety of materials, including metals, plastics, and ceramics.
Application of Scanning electron microscope / SEM
✅Microstructure Analysis in Materials Science
SEM is used to observe the fine structures of metals and alloys. For example, it can be used to detect cracks or defects on the surface of steel or analyze the distribution of components in alloys.
✅Detection of Micro Defects in Semiconductor Industry
In semiconductor manufacturing, SEM is used to detect micro defects on the surface or within microchips. This helps to identify problems early in the production process, improving quality control.
✅Biology: Observation of Cell Surfaces
SEM is also used to study biological samples and their surface structures. It allows high-resolution imaging of the shape of cells or tissues, contributing to research in medicine and biology.
✅Failure Analysis of Electronic Devices
In case of malfunctioning electronics, SEM is used to observe the surface of the circuit boards to identify short circuits or damaged areas. This helps pinpoint the cause of failure quickly.
Manufacture list of Scanning electron microscope / SEM
※Includes information on some trading companies