What is a Probe card?

A probe card is an essential testing tool used for semiconductor wafer testing. It connects the wafer's chips to the tester, allowing for the evaluation of their electrical properties. The probe card is equipped with numerous precision probes (needles) that make contact with the wafer's pads to gather data. It enables non-destructive testing, helping to identify defective chips early in the manufacturing process, reducing costs, and improving quality. Probe cards are adaptable to various chip types and designs, and they require high precision and durability for effective use.

Application of Probe card

✅Electrical Testing of Semiconductor Wafers
Evaluates properties such as continuity, voltage, and current across all chips on a wafer, identifying defective units.
✅Real-time Testing in Production Lines
Quickly tests semiconductor wafers during mass production to maintain manufacturing quality.
✅Testing Newly Designed Chips
Inspects prototypes of semiconductor designs during development to validate their functionality.
✅Quality Assurance for High-performance Chips
Ensures the reliability of high-performance chips by conducting thorough operational and precision tests using probe cards.

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