What is a AFM: Atomic Force Microscope?

An Atomic Force Microscope (AFM) is a high-precision instrument capable of observing and measuring surfaces at the atomic scale. AFM uses a sharp probe that scans the sample surface, detecting interatomic forces to reproduce the surface's shape and characteristics in 3D. Unlike optical or electron microscopes, AFM is not dependent on the sample's conductivity, making it applicable to a wide range of materials, including metals, semiconductors, and insulators.

AFM's key features include nanometer-level resolution and multifunctionality. It can perform not only observation but also analysis of mechanical and chemical properties and even surface manipulation. This makes it invaluable in fields such as semiconductor research, biomedical studies, and materials science.

Application of AFM: Atomic Force Microscope

✅Surface Evaluation of Semiconductor Devices
Analyzes the nanoscale roughness of transistors or circuit surfaces to ensure manufacturing process quality.
✅Characterization of Polymer Materials
Measures surface hardness and viscoelasticity of polymers to optimize the mechanical properties of products.
✅Observation of Biomolecules
Examines the structures of biomolecules such as DNA and proteins at high resolution for pharmaceutical applications.
✅Verification of Surface Modification
Investigates the uniformity of nanostructures or thin films after chemical treatment to improve the accuracy of surface modification processes.

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